目次.pdf

55-2-contents.pdf
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🔗 Source: microscopy.or.jp
📊 Size: 657 KB
📄 Pages: 2 pages
⬇️ Downloads: 106

Summary

The Journal of Microscopy, Vol. 55, No. 2, 2020, features various articles on image and spectra analysis using advanced information science techniques, including noise reduction of electron holograms, recent progress in noise processing and signal isolation of spectral image data, and atomic resolution XEDS mapping for location of dopant elements in metallic compounds. Other topics include operando STEM-EELS of an all-solid-state Li-ion battery, electron energy-loss spectroscopy analysis of dielectric properties of materials, and fluorescence imaging of methylated DNA using protein labeling technique.

Description

The Journal of Microscopy, Vol. 55, No.

Technical Information

  • File Format: PDF
  • File Size: 657 KB
  • Pages: 2
  • Language: EN
  • Total Downloads: 106
  • Last Updated: 6 days ago

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