IEEE Standard For Test Access Port And Boundary-Scan Architecture.pdf

The Institute of Electrical and Electronics Engineers, Inc. defines circuitry that may be built into an integrated circuit to assist in the test, maintenance, and support of assembled printed circuit boards. The circuitry includes a standard interface through which instructions and test data are communicated. A set of test features is defined, including a boundary-scan register, such that the component is able to respond to a minimum set of instructions designed to assist with testing of assembled printed circuit boards. Also, a language is defined that allows rigorous description of the component-specific aspects of such testability features.

A set of test features is defined, including a boundary-scan register, such that the component is able to respond to a minimum set of instructions designed to assist with testing of assembled printed circuit boards. The boundary-scan register is a component that allows for the testing of integrated circuits and printed circuit boards.

The standard defines a test access port and boundary-scan architecture for digital integrated circuits and for the digital portions of mixed analog/digital integrated circuits. The facilities defined by the standard seek to provide a solution to the problem of testing assembled printed circuit boards and other products based on highly complex digital integrated circuits and high-density surface-mounting assembly techniques.

The standard defines a language that allows rigorous description of the component-specific aspects of such testability features. The language is used to describe the boundary-scan register and other test features.

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